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DATA SHEET
MOS FIELD EFFECT TRANSISTOR
2SK2341
SWITCHING N-CHANNEL POWER MOS FET INDUSTRIAL USE
DESCRIPTION
The 2SK2341 is N-channel Power MOS Field Effect Transistor designed for high voltage switching applications.
PACKAGE DIMENSIONS
(in millimeters)
10.0 0.3 4.5 0.2 2.7 0.2
FEATURES
3.2 0.2
* * *
Low On-state Resistance RDS(on) = 0.26 MAX. (VGS = 10 V, ID = 6.0 A)
3 0.1 123 4 0.2
High Avalanche Capability Ratings
Drain to Source Voltage Gate to Source Voltage Drain Current (DC) Drain Current (pulse)
VDSS VGSS ID (DC) ID (pulse)*
250 30 11 44 35 2.0 -55 to +150 150 11 320
V V A A W W C C A mJ
123 0.7 0.1 2.54 TYP.
13.5 MIN. 0.65 0.1
ABSOLUTE MAXIMUM RATINGS (TA = 25 C)
Total Power Dissipation (TC = 25 C) PT1 Total Power Dissipation (Ta = 25 C) PT2 Storage Temperature Channel Temperature Single Avalanche Current Single Avalanche Energy
*PW 10 s, Duty Cycle 1 % **Starting Tch = 25 C, RG = 25 , VGS = 20 V 0
1.3 0.2 1.5 0.2 2.54 TYP.
12.0 0.2
LOW Ciss
Ciss = 1090 pF TYP.
15.0 0.3
2.5 0.1
Tstg Tch IAS** EAS**
1. Gate 2. Drain 3. Source
MP-45F(SIOLATED TO-220)
Drain (D)
The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device is actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.
Source (S) Gate (G) Body diode
Document No. TC-2511 (O.D. No. TC-8070) Date Published January 1995 P Printed in Japan
(c)
1995
2SK2341
ELECTRICAL CHARACTERISTICS (TA = 25 C)
CHARACTERISTIC Drain to Source On-state Resistance Gate to Source Cutoff Voltage Forward Transfer Admittance Drain Leakage Current Gate to Source Leakage Current Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge SYMBOL RDS(on) VGS(off) yfs IDSS IGSS Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) trr Qrr 1090 420 80 20 20 50 15 33 6.0 13 1.0 220 1.0 2.0 3.0 100 100 MIN. TYP. 0.21 MAX. 0.26 4.0 UNIT V S TEST CONDITIONS VGS = 10 V, ID = 6 A VDS = 10 V, ID = 1 mA VDS = 10 V, ID = 6 A VDS = 250V, VGS = 0 VGS = 30 V, VDS = 0 VDS = 10 V VGS = 0 f = 1 MHz VGS = 10 V VDD = 150 V ID = 6 A, RG = 10 RL = 25 VGS = 10 V ID = 11 A VDD = 200 V IF = 11 A, VGS = 0 1F = 11 A di/dt = 50 A/s
A
nA pF pF pF ns ns ns ns nC nC nC V ns
C
Test Circuit 1 : Avalanche Capability
D.U.T. RG = 25 PG. VGS = 20 0 V 50
Test Circuit 2 : Switching Time
D.U.T.
L VDD PG. RG RG = 10
RL VGS VDD
Wave Form
VGS
0 10 % VGS (on) 90 %
ID
90 % 90 % ID 0 10 % td(on) ton tr td (off) toff 10 % tf
BVDSS IAS ID VDD VDS
VGS 0 = 1 s Duty Cycle 1%
ID Wave Form
Starting Tch
Test Circuit 3 : Gate Charge
D.U.T. IG = 2 mA PG. 50
RL VDD
The application circuits and their parameters are for references only and are not intended for use in actual design-in's.
2
2SK2341
TYPICAL CHARACTERISTICS (TA = 25 C)
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA dT - Percentage of Rated Power - % 100 PT - Total Power Dissipation - W 60 50 40 30 20 10
TOTAL POWER DISSIPATION vs. CASE TEMPERATURE
80
60
40
20
0
20
40
60
80
100 120 140 160
0
20
40
60
80
100 120 140 160
TC - Case Temperature - C FORWARD BIAS SAFE OPRATING AREA 100
RD
on S( )
TC - Case Temperature - C DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE 40 Pulsed ID - Drain Current - A 30 20 V 10 V VGS = 8 V
i Lim
ted
ID (pulse)
PW = 10
TC = 25 C Single Pulse
ID - Drain Current - A
ID (DC) 10
20 DC
0
1
10
0
m
s
s
20
m s m s
1
10
10
100
1 000
0
5
10
15
VDS - Drain to Source Voltage - (V)
VDS - Drain to Source Voltage - V
TRANSFER CHARACTERISTICS 100 VDS = 10 V Pulsed TA = -25 C 25 C 75 C 125 C
ID - Drain Current - A
10
1.0
0.1 0
5
10
15
VDS - Drain to Source Voltage - V
3
2SK2341
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH 1000 100 10 1 0.1 0.01 TC = 25 C Single Pulsed 0.001 10 100 1m 10 m 100 m 1 10 100 1000 Rth = 62.5 C/W
(ch-a)
rth (ch-c) (t) (C/W)
Rth (ch-c) = 3.57 C/W
PW - Pulse Width - s RDS (on) - Drain to Source On-State Resistance - FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT yfs - Forward Transfer Admittance - S VDS = 10 V Pulsed DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE 2.0 Pulsed
10
TA = -25 C 25 C 75 C 125 C
1.0 ID = 16 A 8.0 A 3.2 A
1.0
0.1 1.0 10 100
0
10
20
30
ID - Drain Current - A RDS (on) - Drain to Source On-State Resistance - DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT 1.5 VGS = 10 V Pulsed
VGS - Gate to Source Voltage - V GATE TO SOURCE CUTOFF VOLTAGE vs. CHANNEL TEMPERATURE 5.0 VDS = 10 V ID = 1 mA 4.0
1.0
VGS (off) - Gate to Source Cutoff Voltage - V
3.0
0.5
2.0
0 0.1
1.0
10
100
1.0
-50
0
50
100
150
ID - Drain Current - A
Tch - Channel Temperature - C
4
2SK2341
RDS (on) - Drain to Source On-State Resistance - DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE 0.6 ID = 8.0 V VGS = 10 V 0.5 0.4 0.3 0.2 0.1 0 SOURCE TO DRAIN DIODE FORWARD VOLTAGE Pulsed ISD - Diode Forward Current - A 100
10 10 V 1.0 VGS = 0
0.1 0 0.5 1.0 1.5
-50
0
50
100
150
Tch - Channel Temperature - C CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE td (on), tr, td (off), tf - Switching Time - ns
VSD - Source to Drain Voltage - V
SWITCHING CHARACTERISTICS 1000
Ciss, Coss, Crss - Capacitance - pF
VGS = 0 f = 1 MHz 1000 Ciss
tr 100 td
(off)
tf
Coss 100
td 10
(on)
Crss 10 1.0 10 100 1000
0.1 0.1
1.0
VDS = 125 V VGS = 10 V RG = 10 10 100
VDS - Drain to Source Voltage - V
ID - Drain Current - A
DYNAMIC INPUT/OUTPUT CHARACTERISTICS 250 12 VDS - Drain to Source Voltage - V VDD = 200 V 125 V 50 V VGS 10 8 6 100 4 50 VDS 2 0 trr - Reverse Recovery Time - ns ID = 11 A 200 VGS - Gate to Source Voltage - V
REVERSE RECOVERY TIME vs. REVERSE DRAIN CURRENT di/dt = 50 A/ s VGS = 0
150
1000
100
0 0
10
20
30
0.1
1.0
10
100
Qg - Gate Charge - nC
Diode Forward Current - A
5
2SK2341
SINGLE AVALANCHE CURRENT vs. INDUCTIVE LOAD 400 EAS - Single Avalanche Energy - mJ IAS - Single Avalanche Curent - A VDD = 150 V RG = 25 VGS = 20 V 0 IAS < 16 A = SINGLE AVALANCHE ENERGY vs. STARTING CHANNEL TEMPERATURE
IAS = 11 A 10
EA
300
S
=3
20
(m
J)
200
VDD = 150 (V) 1.0 RG = 25 () VGS = 20 (V) 0 10 100 1m 10 m
100
0 25
50
75
100
125
150
175
L - Inductive Load - H
Starting Tch - Starting Channel Temperature - C
6
2SK2341
REFERENCE
Document Name NEC semiconductor device reliability/quality control system. Quality grade on NEC semiconductor devices. Semiconductor device mounting technology manual. Semiconductor device package manual. Guide to quality assurance for semiconductor devices. Semiconductor selection guide. Power MOS FET features and application switching power supply. Application circuits using Power MOS FET. Safe operating area of Power MOS FET. Document No. TEI-1202 IEI-1209 IEI-1207 IEI-1213 MEI-1202 MF-1134 TEA-1034 TEA-1035 TEA-1037
7
2SK2341
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices in "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance. Anti-radioactive design is not implemented in this product.
M4 94.11

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